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1

Characterization of layered synthetic microstructure by transmission electron microscopy and diffraction

Lepêtre, Yves, Rasigni, Georges

Journal:

Year:

1984

Language:

english

File:

PDF, 414 KB

english, 1984

2

Analytical Electron Microscopy Of Multilayered Thin Films Using Microcleavage

Journal:

Optical Engineering

Year:

1986

Language:

english

File:

PDF, 17.25 MB

english, 1986

3

Comparative efficiency of natural crystals and multilayers as dispersing devices in the copper L_2,3 range

Pirocchi, Michel, Barchewitz, Robert, Bodeur, Suzanne, Esteva, Jean-Marc, Lepetre, Yves, Rivoira, René, Philip, René, Rasigni, Georges

Journal:

Year:

1986

Language:

english

File:

PDF, 605 KB

english, 1986

4

Laterally graded period layered synthetic microstructures

Philip, Roger, Rivoira, Rene, Lepetre, Yves, Rasigni, Georges

Journal:

Year:

1988

Language:

english

File:

PDF, 375 KB

english, 1988

5

Characterization of layered synthetic microstructures using transmission electron microscopy

Lepetre, Yves, Rasigni, Georges, Rivoira, René, Philip, Roger, Metois, Jean-Jacques

Journal:

Journal of the Optical Society of America A

Year:

1985

Language:

english

File:

PDF, 2.03 MB

english, 1985

6

SPIE Proceedings [SPIE 1989 Intl Congress on Optical Science and Engineering - Paris, France (Monday 24 April 1989)] Thin Films in Optics - Small Particles And Thin Film TEM Observation On Silicon Substrate

Lepetre, Yves, Tschudi, Theo T.

Year:

1990

Language:

english

File:

PDF, 8.18 MB

english, 1990

7

SPIE Proceedings [SPIE San Dieg - DL Tentative - San Diego, CA (Sunday 1 July 1990)] X-Ray/EUV Optics for Astronomy, Microscopy, Polarimetry, and Projection Lithography - Fabrication and performance at 1.33 nm of a 0.24-um period multilayer grating

Berrouane, H., Khan Malek, Chantal G., Andre, Jean-Michel, Lesterlin, L., Ladan, F. R., Rivoira, Jean-Rene, Lepetre, Yves, Barchewitz, Robert J., Hoover, Richard B., Walker II, Arthur B. C.

Year:

1991

Language:

english

File:

PDF, 447 KB

english, 1991

8

SPIE Proceedings [SPIE 29th Annual Technical Symposium - San Diego (Tuesday 20 August 1985)] Applications of Thin Film Multilayered Structures to Figured X-Ray Optics - Structural Study Of Multilayered Vanadium/Nickel Superlattices

Homma, Hitoshi, Lepetre, Yves, Murduck, James M., Schuller, Ivan K., Majkrzak, C. F., Marshall, Gerald F.

Year:

1985

Language:

english

File:

PDF, 253 KB

english, 1985

9

SPIE Proceedings [SPIE 29th Annual Technical Symposium - San Diego (Tuesday 20 August 1985)] Applications of Thin Film Multilayered Structures to Figured X-Ray Optics - Novel Characterization Of Thin Film Multilayered Structures: Microcleavage Transmission Electron Microscopy

Lepetre, Yves, Schuller, Ivan K., Rasigni, George, Rivoira, Rene, Philip, Roger, Dhez, Pierre, Marshall, Gerald F.

Year:

1985

Language:

english

File:

PDF, 11.26 MB

english, 1985

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